|Keynote : Test is Changing. Are you Ready ?||Watch Recording (Session concluded)|
|Advanced Technologies for Automated Test||Watch Recording (Session concluded)|
|Selecting the Right Digitizer or Oscilloscope for Your Application||Watch Recording (Session concluded)|
|Advancements in Software-Designed I/O for Test||Watch Recording (Session concluded)|
|Evaluating Software Tools and Architectures to Design Test Systems||Thursday, June 26, 2014||02.00 PM - 02.45 PM|
|6 Disruptive Technologies for Design, Test, and Control You Should Know About||Thursday, June 26, 2014||03.00 PM - 03.45 PM|
We are challenged to keep up with the pace of innovation and resulting complexities. Today, design, test, and production require an entire ecosystem of functionality, applications, and technology. It’s not good enough to build a system for today. Learn how to implement a system that will last.
Discover the difference between digitizers and oscilloscopes and the properties of these devices such as spurious-free dynamic range, effective number of bits, sampling speed, and the Nyquist criteria.
NI FlexRIO is one of the most powerful products based on the LabVIEW reconfigurable I/O (RIO) architecture. Learn how to leverage this architecture to design, develop, and deploy high-performance embedded applications.
An important piece of an automated test system is the software framework, which runs the tests, stores the data, and evaluates the results. Learn about a four-layer architecture, the variety of software tools available, and how to choose the best tool for your application.
One of the biggest challenges for design, test, and control engineers and managers is staying current on technology trends. Learn about the six upcoming technologies that have the potential to be disruptive in the area of electronic design, test, and control.